Mass Spectrometer

JEOL JMS-T2000GC AccuTOF GC-Alpha

Product
Specifications
Pictures
Info

JEOL JMS-T2000GC AccuTOF GC-Alpha

The JMS-T2000GC (AccuTOF GC-Alpha) is a fully automated, high resolution GC/MS system. By extending the flight path to 4 meters, the resolution has been increased to 30,000. Besides the electron ionization (EI) ion source, which is provided as standard, a wide variety of additional ion sources are optionally available, for instance:

• Field emission and field desorption sources (EI/FI/FD)
• Photoionization (PI/EI)
• Chemical ionization (CI)

The use of soft ionization techniques (such as PI or FI) enables the identification of molecular ions, which allows for a fast identification of the molecular structure. All ionization sources can be changed without breaking the vacuum. Besides using gas chromatography, the samples can also be introduced using a direct inlet (direct exposure probe DEP, direct insertion probe DIP). This allows for a qualitative and quantitative analysis of liquid or solid samples.

With the design of the mass analyzer being based on a reflectron TOF-MS, not only quantitative and qualitative analyses but also highly accurate mass measurements can be performed at ease. The user-friendly setup of the JMS-T2000GC enables the efficient acquisition of highly reliable and high-quality data.

Specifications

Equipment type

TOF mass spectrometer

Mass accuracy

≤ 1 ppm (with internal standard)

Mass Resolution

R ≥ 30,000 (FWHM) 

Sensitivity

S/N ≥ 300 for 1pg OFN

Data recording speed

Up to 50 spectra/s

Mass range

4-6,000 u

Ionization modes

EI, CI, FI, PI, FD, DIP, DEP, FD

Sample inlets

GC, DEP, DIP, FD probe

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects. Please use the following contact form (* = mandatory field) for your questions.

Choose Contact type*

Your Contact details*



News from JEOL


Message to JEOL

Disclosure of personal data to third parties

This website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data. Further information on the used cookies and withdrawal can be found in our data privacy statement.
Your consent is voluntary, not necessary for using the website and can be withdrawn anytime.
You can accept or decline the transfer and processing of data by the following services.

I have read and understood the notes on privacy. I agree to the transfer and storage of my data according to the data privacy statement. I know that I have the right to withdraw this consent at any time without giving any reason, without affecting the lawfulness of the data processed after my consent and until withdrawal.