Range of application

Modern paintwork is usually performed as a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. Our systems make it easy to examine the cross-section of the layers of paint.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd. / CP brochure

Specific preparation methods must be used for the high-resolution imaging and analysis of biological samples in an electron microscope. Food stuffs and their constituents in particular can only be imaged artifact-free through active cooling. JEOL electron microscopes are therefore prepared as standard for the installation of cryogenic systems so that sensitive samples can be prepared externally, transferred in a cooled state and subsequently examined in a cryogenic mode of operation.

Electron microscope image of powdered milk

Source data: JEOL (Germany) GmbH, DIL Quakenbrück

Modern paintwork is usually a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. JEOL preparation systems enable the simple and reproducible production of artifact-free cross-sections.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd., CP brochure

Metal powders are used for producing metal ceramics, among other things, with the density and structure of the powder playing an important role. With JEOL microscopes it is possible to image the structure and material composition down to the last detail. JEOL supplies an established and powerful complete solution for simple, artifact-free preparation and high-resolution imaging and analytics.

SEM image of a metallic powder

Source: JEOL (Germany) GmbH

The formation of precipitates is used systematically to define the mechanical properties of a metallic structure. However, as a form of contamination, these can also be undesired. In order to be able to judge the quality of an alloy, it is necessary to determine the morphology and chemical composition of the precipitates. This is why JEOL supplies all-round, complete solutions, from artifact-free sample preparation to high-resolution analysis from the µm to the nm level.

Element mapping image of a brass alloy

Source data: JEOL (Germany) GmbH

Fibres are used in many branches of industry, e.g. in textile processing or as a structural material in mechanical engineering. Their structural properties can be studied by means of a fibre cross-section, for example. JEOL supplies an established and powerful complete solution for simple, artifact-free preparation and high-resolution imaging and analytics.

SEM image of a cross-section through a fibre bundle

Source data: JEOL Ltd., Ion Slicer brochure

Minerals are frequently complex structures formed from a multitude of elements. Element mapping images are one of the most important methods for achieving the spatially resolved visualisation of the chemical composition. These mapping images can be used to gather essential information on e.g. the creation and structure of the samples under examination. For this task, JEOL supplies the most stable and most energetically and spatially high-resolution spectroscopy systems.

Element mapping images of a symplectite microsection

Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)

Many of today's material systems are being functionalised. Tailor-made properties, such as abrasion resistance, colour or chemical resistance, are achieved by forming multi-layer systems on substrates. The systems manufactured by JEOL simplify the examination of these coating systems. JEOL supplies complete solutions from artifact-free preparation to automated and reproducible extraction of relevant parameters such as layer thickness or roughness.

Coating system on a metallic substrate

Source data: JEOL (Germany) GmbH

In modern semiconductor components, complex, functional structures have to be installed in an ever smaller space. In order to be able to reliably pinpoint and identify faults, it is essential to analyse precisely the structure and the element map. With the automated systems from JEOL, it is possible to prepare, image and analyse semiconductor components for faults precisely with the greatest accuracy.

Three-dimensional element map of a NAND circuit

Source data: JEOL Ltd., JEM-2800 brochure/presentation

In the electronics industry, integrated circuits and components have to be connected by wires. The failure of this interface is one of the commonest causes of failure of these components. Characterising the quality of this interface requires pinpoint-accurate cross-sectional preparation without any thermomechanical load on the wire. JEOL systems enable the quick, simple, artifact-free and pinpoint-accurate preparation and detailed characterisation of this interface.

Cross-section through the bond pad of a light emitting diode.

Source data: JEOL (Germany) GmbH