JEOL JSM-IT710HR InTouchScope™
JEOL JSM-IT710HR InTouchScope™
Increasing requirements require constant further development. Therefore, the JSM-IT710HR was developed based on the successful series of JEOL InTouchScope ™ SEMs.
The new high-brightness field emission electron source enables high-resolution imaging and fast analyses with high sensitivity and spatial resolution.
With its intuitive user interface and the fully integrated JEOL EDS system, the modern SEM sets new standards in terms of usability in the field emitter class. The JSM-IT710HR effortlessly combines high resolution and user comfort like a table-top SEM. The seamless transition between light-optical and SEM images through simple zooming not only contributes to easy operation and orientation. As the first FEG-SEM, users can display 3D images of the sample surface with overlaid chemical information in real time enabling dramatically improved work efficiency.
Features
We proudly introduce a new addition to our JEOL InTouchScope™ series SEMs, the JSM-IT700HR.
Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.
This state-of-the-art SEM, with its high-brightness electron gun system, provides amazing high-resolution imaging along with high sensitivity and high spatial resolution analysis at even faster speeds.
- "Zeromag" function links holder graphics, light-optical and SEM images to simplify sample navigation
- Our embedded EDS system shows real time EDS spectra and mappings during image observation for efficient elemental analysis
- SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data
- "Specimen Exchange Navi" for safe and simple specimen exchange
- With the newly-developed Auto Beam Alignment function, the electron optical conditions are always kept at an optimum
- Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis
- Compact design with small footprint
Specifications
Resolution
(HV) |
1.0 nm (30 kV); 3.0 nm (1.0 kV) |
Resolution (Analysis) |
3.0 nm (15 kV, Probe current 3 nA) |
Resolution
(LV) | 1.8 nm (15 kV BED) |
Direct
magnification |
x 5 to
x 600,000 |
Electron
gun |
High
brightness electron gun |
Accelerating
voltage |
0.5 kV to
30 kV |
Probe
current | few pA to 300 nA |
LV
pressure adjustment | 10 to 150
Pa |
Automatic
functions | Filament
adjustment, Gun alignment, |
Maximum
specimen size | 200 mm
diameter, 75 mm height |
Specimen
stage | X: 125
mm Y: 100 mm Z: 80 mm |
Image
modes | Secondary
electron image, REF image, Compositional image,Topographic image, Stereo-microscopic image |
Please note:
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.