Scanning Electron Microscopes (SEM)

JEOL JSM-IT700HR InTouchScope™


JEOL JSM-IT700HR InTouchScope™

Built off of the highly successful predecessor of our InTouchScope™ series SEMs, the JSM-IT700HR was developed to meet increasing demands in the market place. This new SEM breaks through the conventional general-purpose SEM in terms of high resolution imaging and high spatial-resolution analysis, by incorporating a new high-brightness electron gun. Furthermore, integration of JEOL’s energy dispersive X-ray spectrometer (EDS) into the JSM-IT700HR allows for seamless acquisition from image collection to elemental analysis.

The JSM-IT700HR adopted our Multi Touch Operating System that has been highly regarded in our InTouchScope™ series. The touch screen interface incorporates various automatic functions.“Specimen Exchange Navi”enables acquisition of high-quality data without complicated condition setup and area search.

The JSM-IT700HR integrateshigh performance with unprecedented ease of use, enabling dramatically improved work efficiency.


We proudly introduce a new addition to our JEOL InTouchScope™ series SEMs, the JSM-IT700HR.

Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.

This state-of-the-art SEM, with its high-brightness electron gun system, provides amazing high-resolution imaging along with high sensitivity and high spatial resolution analysis at even faster speeds.

  • "Zeromag" function links holder graphics, CCD and SEM images to simplify sample navigation.
  • "Live Analysis", our embedded EDS system, shows real time EDS spectra during image observation for efficient elemental analysis.
  • SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data "Specimen Exchange Navi" enables safe and simple specimen exchange.
  • With the newly-developed Auto Beam Alignment function, the electron optical conditions are always kept optimum.
  • Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  • Compact design with small footprint.


  • Low Vacuum Secondary Electron Detector (LSED)
  • Energy Dispersive X-Ray Spectrometer (EDS)
  • Wavelength Dispersive X-Ray Spectrometer (WDS)
  • Electron Backscatter Diffraction Detector (EBSD)
  • Load Lock Chamber (pre-evacuation chamber)
  • Stage Navigation System (SNS)
  • Chamber Scope (CS)
  • Operation Panel
  • 3D Measurement Software


Resolution (HV)

1.0 nm (30 kV); 3.0 nm (1.0 kV)

Resolution (Analysis)

3.0 nm (15 kV, Probe current 3 nA)

Resolution (LV)

1.8 nm (15 kV BED)

Direct magnification

x 5 to x 600,000
(reference image 128 mm x 96 mm)

Electron gun

High brightness electron gun

Accelerating voltage

0.5 kV to 30 kV

Probe current

few pA to 300 nA

LV pressure adjustment

10 to 150 Pa

Automatic functions

Filament adjustment, Gun alignment,
Focus / Stigmator / Brightness / Contrast

Maximum specimen size

200 mm diameter, 75 mm height

Specimen stage

X: 125 mm Y: 100 mm Z: 80 mm
Tilt: -10° to 90° Rotation: 360°

Image modes

Secondary electron image, REF image, Compositional image,Topographic image, Stereo-microscopic image

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects. Please use the following contact form (* = mandatory field) for your questions.

Choose Contact type*

Your Contact details*

News from JEOL

Message to JEOL

Disclosure of personal data to third parties

This website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data. Further information on the used cookies and withdrawal can be found in our data privacy statement.
Your consent is voluntary, not necessary for using the website and can be withdrawn anytime.
You can accept or decline the transfer and processing of data by the following services.

I have read and understood the notes on privacy. I agree to the transfer and storage of my data according to the data privacy statement. I know that I have the right to withdraw this consent at any time without giving any reason, without affecting the lawfulness of the data processed after my consent and until withdrawal.