JEOL launches completely redesigned high-end FIB system


The completely redesigned JIB-PS500i focused gallium ion beam (FIB) preparation system enables the fabrication, high-resolution imaging and analysis of thin TEM lamellae and cross-sections with unprecedented simplicity.
Especially in booming technology sectors such as battery or semiconductor production, ever higher demands are placed on the materials used. This increasingly requires a deep understanding of the fundamental workings even on the atomic scale. The new JEOL FIB system is designed to enable simple and high-quality preparation processes for high-resolution electron microscopy. Due to the large chamber and the very flexible stage, even large wafer samples can be processed for later TEM analysis. Thanks to newly designed software and fully integrated handling tools, this process is largely automated and easy to control even for beginners. New, integrated detectors also enable high-resolution imaging and EDX analysis already in the FIB system.

Find out more on our product page for the new FIB

Disclosure of personal data to third parties

This website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data. Further information on the used cookies and withdrawal can be found in our data privacy statement.
Your consent is voluntary, not necessary for using the website and can be withdrawn anytime.
You can accept or decline the transfer and processing of data by the following services.

I have read and understood the notes on privacy. I agree to the transfer and storage of my data according to the data privacy statement. I know that I have the right to withdraw this consent at any time without giving any reason, without affecting the lawfulness of the data processed after my consent and until withdrawal.